研究领域

集成电路设计及验证

论文与著作

[1] SHI Jun.ESD Characteristics of GGNMOS Device in Deep Sub-micron CMOS Technology,2016International Conference on Audio, Language and Image  Processing (ICALIP 2016), 09 Feb. 2017. ©2017Elsevier B.V. (EI)

[2] 史君.GAANWFET晶体管ESD特性研究,上海建桥学院学报,2018第3期

[3] SHI Jun.Deep sub-micron ESD GGNMOS layout design and optimization,MATEC Webof Conference volume 198,04009(2018), MEAE 2018. ©2019 Elsevier B.V. (EI)

[4] SHI Jun.Bandgap Reference Layout Analysis and Design, InternationalJournal of Information and Electronics Engineering, Vol. 9, No. 1, March 2019.（EI Inspec）

[5] SHI Jun.Layout optimizations of operational amplifier in deep submicron,INTL.Journal of Electronics and Telecommunications, 2020,VOL.66,NO.2,PP.287-293. ©2020 Elsevier B.V. (EI)

[6] SHI Jun.Optimization for Interconnection Design in Deep Submicron Integrated Circuits,INTL. Journal of Electronics and Telecommunications, 2020,VOL.66,NO.4,PP.632-638. ©2020 Elsevier B.V. (EI)

[7] SHI Jun.Optimization of Bandgap Reference with High PSRR on Deep Submicron,INTL. Journal of Electronics and Telecommunications, 2021,VOL.67,NO.1,PP.956-961. ©2021 Elsevier B.V. (EI)

[8] 史君,喻玲.集成电路版图分析与设计课程教改与探索,电气电子教学学报, 2021(5).

荣誉与奖励

《集成电路版图分析与设计》2019年荣获上海市教委重点课程建设项目；荣获2020年度上海建桥学院教学奖第一名；荣获2021年度上海建桥学院质量工程项目奖。