目录

  • 1 第一单元
    • 1.1 晶体衍射实验实践指导
    • 1.2 晶体学介绍
  • 2 晶体上样操作
    • 2.1 衍射实验-晶体上样及对心介绍
    • 2.2 晶体样品装样过程
    • 2.3 显微镜下的晶体挑选
    • 2.4 Synergy仪器的开关门及上样
    • 2.5 FRX仪器的开关门及上样
    • 2.6 大分子晶体预先冷冻上样方法
    • 2.7 晶体对心过程
  • 3 数据收集软件操作
    • 3.1 CrysAlispro-小分子数据采集
    • 3.2 CrysAlispro-大分子晶体粗筛设置
    • 3.3 晶体衍射实验仪器操作
    • 3.4 晶体衍射数据质量判定
  • 4 结构解析和精修
    • 4.1 结构解析介绍
    • 4.2 分析软件安装
    • 4.3 结构解析操作
    • 4.4 checkcif report生成
    • 4.5 CIF文件生成晶体学数据表
    • 4.6 蛋白晶体数据处理
    • 4.7 晶面指标化
    • 4.8 移除无序部分,保存为有序结构
    • 4.9 去除精修的限制命令
  • 5 checkcif回复及其修正
    • 5.1 412_ALERT_2_B修正
    • 5.2 PLAT342_ALERT_3_B回复
    • 5.3 THETM01_ALERT_3_A
    • 5.4 PLAT029_ALERT_3_A
    • 5.5 PLAT910_ALERT_3_B
    • 5.6 VRF回复方法
  • 6 审稿人意见回复案例
    • 6.1 实际案例1-限制与对称
  • 7 虚拟仿真实验
    • 7.1 虚拟仿真实验体验介绍
    • 7.2 虚拟仿真实验体验项目
  • 8 FAQ常见问题
    • 8.1 如何查看晶体结构?
    • 8.2 TwinRot不正常工作
    • 8.3 twin检测
    • 8.4 OLEX多个溶剂分子的输入格式
    • 8.5 如何生成二维衍射图片
    • 8.6 如何判断预实验结果的好坏?
  • 9 结晶实验操作
    • 9.1 结晶实验-结晶机器人操作
      • 9.1.1 结晶机器人操作
      • 9.1.2 结晶机器人关机步骤
      • 9.1.3 LCP设置不当与96板运行
      • 9.1.4 仪器未按照流程关机事故
  • 10 JAN UVEX-P 操作
    • 10.1 UVEX - P 操作步骤
THETM01_ALERT_3_A

PURPOSE:To check that _diffrn_reflns_theta_max is greater than expected limits.
===============================================================
PROCEDURE:
CALCULATE

S = SIN [_diffrn_reflns_theta_max] / _diffrn_radiation_wavelength

TEST

IF S < 0.55 issue ALERT A
   "Alert A The value ofsine(theta_max)/wavelength is less than 0.550"
< 0.575 issue ALERT B
   "Alert B The value ofsine(theta_max)/wavelength is less than 0.575"
< 0.59 issue ALERT C
   "Alert C The value ofsine(theta_max)/wavelength is less than 0.590"

 

The value of sine(theta_max)/wavelength is less than 0.550Calculated sin(theta_max)/wavelength =   0.5187

=============================================================================

Meaning: The resolution of the data is 0.96 A (1/2*0.5187). itis lower than 0.84 A recommended by IuCR. And the possible reasons are asfollows:

=================================================================


 

The Commission on Journals has determined that setting the  maximum sin(theta)/lambda for measurements to at least 0.6 is both optimal  and achievable for most structural studies. The extent of the data not only  affects the ratio of measurements to refined parameters and hence the  accuracy of the atomic and geometric parameters, but also the reliability of  the angular dependent terms, such as Uijs.

 

It is unlikely that any submitted CIF which contains the  results of a data collection with a lower theta(max) will be accepted for  publication unless there are exceptional circumstances. Old data claimed to  have been collected when less stringent criteria were in place will not be  excepted.

 

You should routinely set your diffractometer so that a  theta(max) of 25 deg. for Mo radiation or 67 deg. for Cu radiation is the  minimum that is achieved. If the crystal diffracts sufficiently well, it is  strongly recommended that theta(max) is set to an even higher value.

 

It is understood that there may be little point in collecting  background "noise" when a weakly diffracting crystal gives no  detectable diffraction above theta values well below our required limit. In  such a case, you should first ensure that you have conscientiously undertaken  all possible steps to ensure that the experiment has been able to extract the  best diffracting power from your sample. To this end, all of the following  options should have been exhausted:

 

(a) The best possible crystal has been sought and utilised for  the data collection. If the crystal was small or of poor quality, are you  sure that a better or bigger one cannot be obtained? The chosen crystal may  have been the best one in the batch, but had enough effort and patience  really been expended in the crystallisation attempt? Often, lack of  experience, impatience or unwillingness to try another crystallisation  technique or solvent leads to the experimentalist abandoning crystallisation  attempts before the optimal conditions have been found. Before you blame the  crystal quality, be sure that you have convinced yourself that nothing  further can be done in this direction.

 

(b) Use low temperature measurements to enhance the reflection  intensities and the extent of the "observed" data.

 

(c) For organic compounds, try data collection with Cu  radiation, which significantly enhances the reflection intensities.

 

(d) A full set of data was collected, however the high  angle data was dominated by noise [I/sigma(I) < 1.0] and was omitted.